
Micro QR Code on Silicon
Direct laser marking on silicon for chip- and die-level traceability, with multiple demonstrated code scales.
Laser Micro-Marking
Permanent, high-resolution laser marking for semiconductor, optical, MEMS and precision components.
博隆提供微型 QR Code、Data Matrix、產品識別碼與透明基材內部標記製程,協助客戶建立晶粒、元件及產品單位層級的永久追溯能力。
Capability Overview
Bolite’s laser micro-marking process creates permanent identification features directly on component surfaces, edges, or inside transparent substrates. It is designed for applications where marking space, contamination control, readability, and long-term traceability are critical.
博隆依據材料特性、標記位置、代碼尺寸、資料長度、讀取設備與後續製程條件,建立適合的雷射波長、光束參數、掃描路徑與影像辨識方案。
Key Capabilities
以下六項模組可作為其他 Capability 詳細頁的標準卡片區塊,替換標題與內容即可延伸為不同製程頁面。
Demonstrated Results
案例展示不同材料、產品層級與標記位置。實際規格須依材料、表面條件、代碼內容與讀取方式重新確認。

Direct laser marking on silicon for chip- and die-level traceability, with multiple demonstrated code scales.

Glass surface-marking case demonstrating micro QR codes down to 50 × 50 µm.

Device-level identification directly on a MEMS microphone package for production traceability.

Laser-etched μ-QR code on the edge of the automotive lens for traceability.
Materials
實際可行性依材料組成、鍍膜、厚度、表面狀況、標記深度、代碼尺寸及讀取方式評估。
Applications
Wafer、die、MEMS 與封裝元件單位追溯。
鏡片、玻璃與透明元件永久識別。
車用鏡頭、感測器與電子元件履歷追蹤。
小型化、高價值與高可靠度元件識別。
Development Workflow
Information Required
資訊越完整,越能快速判斷可行性、測試方法與預估開發範圍。
Final specifications, acceptance criteria and delivery scope are confirmed after sample and process feasibility review.
Start a Marking Evaluation
提供樣品材料、標記位置、代碼尺寸與讀取需求,博隆技術團隊將協助評估合適的雷射標記方案。詳細製程參數與專有技術可於 NDA 與專案協議下進一步討論。