Features Overview

Micro-PL for micro led inspection

Measure PL image and spectrum simultaneously

Multiple light source for microscopy illumination

Our microscopy can combine with laser, LED or other light source. We can provide different illuminated direction, such as co-axial, side and transmission and control property of light, such as polarization, beam shape, and intensity .

Differential interference contrast (DIC) image for TFT circuit

DIC is an optical microscopy technique used to enhance the contrast in samples

Scanning laser excitation single micro LED photoluminescence image and spectrum measurement

Bolite multi function microscopy can combine with laser for micro photoluminescence spectrum and image measurement.

• Precisely locate the target object within a field of view, record the photoluminescence spectrum and image.

• Combined with high-speed scanning laser and data acquisition, All of spectral and image information within a field of view can be quickly obtained.

Diffraction limited microscopy image for 300 nm pitch binary grating

Unique optical design to enhanced image resolution