Applying extended laser depth of focus module to transparent material processing.
Bolite’s extended laser depth of focus module can combine with laser beam scanning system and scanning microscopy
The depth of focus (DOF) of module is more than 5 times to traditional focal Gaussian beam. The benefit can be applied to transparent material laser processing.
Long DOF can be applied to laser excited scanning microscopy, such as multi-photon absorption microscopy and keep high spatial resolution. Bolite’s extended laser depth of focus module can combine with laser beam scanning system.
General specifications
Laser wavelength: from 257 to 1070 nm
Depth of focus: tens um to tens mm (depend on focusing optics)